GATS-7755 Substrate Open/Leak Automatic Inspection System
“High speed & accuracy inspection for Fine Pitch FC-CSP, Next-generation’s inspection system available for core-less substrate!” The GATS-7755 is a substrate inspection system with Double-table (shuttle style) which is suitable for batch inspection of mass-produced fine-pitch boards. The GATS-7755 tester can perform Open/Short inspection for MCM/MCP/BGA/CSP, etc.
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機能・特性
- Double-table, shuttle style. Aligning the board while performing inspection simultaneously.
- ULTRA high accuracy, comprehensive alignment accuracy within 2.5μm.
- Standardized universal work holder, standardized work holder is installed (universal/dedicated).
- Best for core-less substrate, Achieving testing 0.1mm board.
- High speed inspection, employing cable-less scanner boards, data processing speed increase.
製品情報
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Manufacturer
NIDEC-READ -
Manufacture Process
Testing / Inspection / QA -
Product
GATS-7755 Substrate Open/Leak Automatic Inspection System
